Device and method of testing dual-frequency nonlinear vector network parameters
US10168369B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 6, 2016 |
| Grant date | Jan 1, 2019 |
| Priority date | — |
| Expiry date | Sep 6, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R35/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device and method of testing the dual-frequency nonlinear vector network parameters. In view of the challenge of the nonlinear behavioral model characterization of the microwave device components, and the current situation of the nonlinear vector network parameter testing, the disclosed device and method of testing the dual-frequency nonlinear vector network parameters redefines the nonlinear model parameters of the nonlinear device components, gives the definition of the test parameter (W-parameter), solves the challenges of the dual-frequency nonlinear behavioral model characterization and testing for the microwave device components, and makes it more convenient to measure the nonlinear characteristics of the mixer, amplifier and passive device components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.