Method and apparatus for quantifying properties of an object through magnetic resonance imaging (MRI)
US10168405B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Nov 11, 2015 |
| Grant date | Jan 1, 2019 |
| Priority date | — |
| Expiry date | Mar 26, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/5611
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided are a method and apparatus for processing a magnetic resonance (MR) image of an object including first and second materials on a magnetic resonance imaging (MRI) apparatus by using multi-parameter mapping including applying to the object a plurality of radio frequency (RF) pulses separated by a first repetition time and a second repetition time, the first repetition time and the second repetition time being determined based on the first material and the second material; undersampling first MR signals corresponding to the first material and second MR signals corresponding to the second material in a K-space; and performing matching between the undersampled first and the undersampled second MR signals and a signal model for the multi-parameter mapping to determine attribute values corresponding to the first and the second materials at at least one point in an MR image of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.