Measuring device and a method for measuring a high-frequency signal with deembedding
US10168411B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 13, 2014 |
| Grant date | Jan 1, 2019 |
| Priority date | — |
| Expiry date | Oct 13, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R35/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a measuring device for measuring a high-frequency signal and a method for correcting a high-frequency signal superposed with measurement errors by means of the measuring device. The measurement is a time-domain measurement in real-time. The measuring device provides a measurement-signal input, an analog digital converter and a processing unit, wherein the measurement-signal input is connected to a device under test in order to measure the high-frequency signal. According to the invention a deembedding unit is arranged in the signal path of the measuring device between analog-digital converter and the processing unit in order to compensate measurement errors resulting from the connection of devices under test and measuring devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.