Image inspection device and method
US10169859B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 31, 2017 |
| Grant date | Jan 1, 2019 |
| Priority date | — |
| Expiry date | Aug 11, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An image inspection device includes a rotating platform configured to carry a workpiece; a first image capturing device configured to capture a top-view image of the workpiece; a second image capturing device configured to capture a lateral-view image of the workpiece; a storage unit configured to pre-store a plurality of lateral-view images of a standard workpiece from different angles; and a processing unit. The processing unit controls the rotating platform to rotate the workpiece to a first angle and a second angle according to the top-view image. The processing unit is configured to generate a first comparison result and a second comparison result by comparing the lateral-view images of the workpiece with lateral-view images of the standard workpiece from, respectively, the first angle and the second angle, and determine whether the workpiece has a defect according to the first comparison result and the second comparison result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.