Method and system for optical vector analysis
US10171174B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 5, 2017 |
| Grant date | Jan 1, 2019 |
| Priority date | — |
| Expiry date | Jul 5, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/07955
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
An apparatus comprises a phase modulator having a first input port to receive a radiation and having a first output port to provide a first signal toward a device under test (DUT), wherein the phase modulator is configured to generate the first signal by performing phase modulation on the radiation received at the first input port; an intensity modulator having a second input port to receive the radiation and having a second output port to provide a second signal toward the DUT, wherein the intensity modulator is configured to generate the second signal by performing intensity modulation on the radiation received at the second input port; and a transfer function analyzer configured to determine a transfer function of the DUT based on the first signal and the second signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.