Selective decimation and analysis of oversampled data
US10175070B2 · kind B2 · utility
1Cited by
2References
4Claims
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Key dates
| Filing date | Aug 4, 2017 |
| Grant date | Jan 8, 2019 |
| Priority date | — |
| Expiry date | Aug 4, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D18/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Useful and meaningful machine characteristic information may be derived through analysis of oversampled digital data collected using dynamic signal analyzers, such as vibration analyzers. Such data have generally been discarded in prior art systems. In addition to peak values and decimated values, other oversampled values are used that are associated with characteristics of the machine being monitored and the sensors and circuits that gather the data. This provides more useful information than has previously been derived from oversampled data within a sampling interval.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.