Method for monitoring a measuring device of automation technology
US10175089B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 12, 2014 |
| Grant date | Jan 8, 2019 |
| Priority date | — |
| Expiry date | Aug 12, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/64
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for monitoring a measuring device of automation technology, wherein the measuring device has a capacitive sensor the sensor has at least one capacitor, and the at least one capacitor is applied for determining or monitoring a process variable. A loss resistance of the at least one capacitor is measured by determining the charge state of the at least one capacitor at a first point in time and at a subsequent, second point in time, and, based on a change of the charge state between the first point in time and the second point in time, information is won concerning disturbance of the ability of the measuring device to function.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.