Method and apparatus for characterization of terahertz radiation
US10175111B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 4, 2015 |
| Grant date | Jan 8, 2019 |
| Priority date | — |
| Expiry date | Mar 19, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/0224
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for characterizing terahertz radiation using spectral domain interferometry, comprising overlapping a pump beam and a terahertz beam in a detecting crystal; obtaining two probe pulses by propagating the probe beam into a polarization maintaining single-mode optical fiber after the detecting crystal; and measuring a change in the optical path difference between the two probe pulses. The system comprises a detection crystal, where a terahertz pulse and a probe beam are made to overlap; a polarization-maintaining optical fiber propagating the probe beam after the detection crystal and outputting two probe pulses; and a spectrometer where the two probe pulses interfere.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.