XRF analyzer for light element detection
US10175184B2 · kind B2 · utility
2Cited by
4References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 2, 2016 |
| Grant date | Jan 8, 2019 |
| Priority date | — |
| Expiry date | Aug 1, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J35/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention includes an XRF analyzer with reduced x-ray attenuation between sample and target and between sample and detector. Attenuation can be reduced by removing atmospheric-air paths through which the x-rays must travel. Reduced x-ray attenuation can allow for easier detection of low-atomic-number elements. Cost saving can be achieved by reducing the number of x-ray windows.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.