Measuring system and measuring method with power calibration
US10180458B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 13, 2015 |
| Grant date | Jan 15, 2019 |
| Priority date | — |
| Expiry date | Dec 23, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R21/133
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measuring system for performing measurements on a device under test is provided. The measuring system comprises a measuring device, a probe connected to the measuring device, a power sensor and a positioning unit. The positioning unit is adapted to connect the probe to the power sensor in a first configuration and to the device under test in a second configuration. The measuring device is adapted to generate a first signal. The probe is adapted to supply the first signal to the power sensor and the first configuration and to supply the first signal to the device under test and the second configuration. The power sensor is adapted to determine the power of the first signal and the first configuration. The measuring device is adapted to regulate the power of the first signal in the second configuration based upon the power determined by the power sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.