Semiconductor device

US10180711B2 · kind B2 · utility

Assignee

• RENESAS ELECTRONICS CORPORATION · JP

Inventors

• Yuko Kitaji · Kodaira, JP
• Kazuki Fukuoka · Kodaira, JP
• Ryo Mori · Tokyo, JP
• Toshifumi Uemura · Kodaira, JP

Key dates

• Filing date: Jul 29, 2016
• Grant date: Jan 15, 2019
• Expiry date: Oct 3, 2036

Classification

• Technology area (CPC —): General

Abstract

There is provided a semiconductor device that can follow a fast voltage change such as a large voltage drop occurring at the time of rapid load fluctuation. The semiconductor device includes a voltage sensor which monitors a power supply voltage at a sampling speed higher than the assumed frequency of power supply voltage fluctuation and outputs a voltage code value, a voltage drop determination circuit which determines, from the voltage code value, that a voltage drop causing a malfunction of a system occurs, and outputs a clock stop signal, and a clock control circuit which controls clock stop, restart, and frequency change.