Identification, quantification and prediction of free silicon in geological formation and its contribution to rock properties
US10184906B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 4, 2016 |
| Grant date | Jan 22, 2019 |
| Priority date | — |
| Expiry date | May 4, 2036 |
Classification
- Technology area (CPC E)Fixed Constructions
- CPC primaryE21B25/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Predicting and quantifying free silicon in a geological formation generates free silicon data for a physical sample obtained from within the geological formation. The free silicon data include identification of portions of the physical sample containing free silicon and a quantification of the free silicon contained in the portions of the physical sample containing free silicon. A modified petro-elastic model for the geological formation comprising rock constituents is generated that incorporates free silicon as one of the rock constituents and that quantitatively models how free silicon changes elastic properties within the geological formation. A three-dimensional model of the geological formation is created that indicates volumes of free silicon throughout the geological formation. The three-dimensional model is created using geophysical data obtained from the physical sample, seismic data covering the geological formation and the modified petro-elastic model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.