Testing circuit board with self-detection function and self-detection method thereof
US10184976B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 14, 2017 |
| Grant date | Jan 22, 2019 |
| Priority date | — |
| Expiry date | Jul 22, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure illustrates a testing circuit board with self-detection function and a self-detection method. A test for a to-be-tested circuit board is executed and a self-detection for a testing circuit board is performed by a JTAG chip. After the self-detection is passed, a first JTAG connection interface and a second JTAG connection interface are conducted by a controller, a multiplexer and a switch chip, to connect test circuit boards in series. Therefore, the efficiency of solving self-detection of JTAG chip with series connection conveniently and quickly may be achieved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.