Synchronized test master
US10185627B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 30, 2015 |
| Grant date | Jan 22, 2019 |
| Priority date | — |
| Expiry date | Feb 27, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/84
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems, methods, and other embodiments associated with a synchronized test master are described. In one embodiment, a method periodically synchronizing test master data to a source database by, at a synchronization time: modifying the test master data to reflect changes to the source database since a last synchronization time; populating a transaction log with data manipulation operations performed on the source database since a last transaction time; and taking a snapshot of the test master data. Synchronization data is derived from the transaction log that includes a snapshot time for the snapshot and a modification time for each data manipulation operation in the transaction log. The method includes storing the synchronization data and snapshot for use in generating a test database that represents a point-in-time version of the source database.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.