Patent · US Active

Initial stress and eigenstrain computation system and method

US10185791B2 · kind B2 · utility

0Cited by
0References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 5, 2016
Grant dateJan 22, 2019
Priority date
Expiry dateApr 4, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2113/26
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A system and method are provided for estimating initial stresses in and eigenstrains of a material. The system may receive measured geometric data including measurements of a material before and after the application of a manufacturing process thereto. The measurements may indicate a residual stress in a coupon after application of the manufacturing process. Estimated linear elastic strains may be calculated in respective opposing sides of the coupon based on the measured geometric data. A linear elastic reaction of the material to the manufacturing process may be calculated based at least in part on the estimated linear elastic strains. The system may then calculate an estimated initial stress in the material as a sum of the residual stress in the coupon and the linear elastic reaction of the material, and calculate an estimated eigenstrain of the material based at least in part on the estimated initial stress in the material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.