Automatic large-scale imaging device diagnostics
US10185892B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 30, 2014 |
| Grant date | Jan 22, 2019 |
| Priority date | — |
| Expiry date | Jun 1, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V30/1916
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Diagnostics may be performed on imaging devices such as digital cameras that are provided in large numbers, or mounted in arrays or networks, by providing imaging data captured from such devices to a machine learning system or classifier that has been trained to recognize anomalies based on imaging data. The machine learning system or classifier may be trained using a training set of imaging data previously captured by one or more imaging devices that has been labeled with regard to whether such imaging devices encountered any anomalies when the imaging data was captured, and if so, which anomalies were encountered. Additionally, a perceptual score which represents the quality of a given image or imaging data may be calculated and used to rank or define the image or imaging data in terms of quality, or determine whether the image or imaging data is suitable for its intended purpose.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.