Current-actuated-display backplane tester and method
US10186179B2 · kind B2 · utility
1Cited by
6References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 20, 2009 |
| Grant date | Jan 22, 2019 |
| Priority date | — |
| Expiry date | Dec 1, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2360/147
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A backplane test system is provided that uses a pressed or deposited resistive film and infra-red (IR) imaging to visualize and quantify the current drive of pixels. In one form, the system is used for measuring organic light-emitting-diode (OLED) backplanes or other current-actuated-display (CAD) backplanes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.