Method for measuring the thickness of a layer of rubber-like material
US10190863B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 11, 2015 |
| Grant date | Jan 29, 2019 |
| Priority date | — |
| Expiry date | Jan 17, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/123
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is provided for measuring a thickness of a layer of rubber-like material. The layer of rubber-like material includes a free face in contact with air and a face joined to an adjacent reinforcement made of elements electrically insulated from one another. Each of the elements includes at least one hysteretic material having a magnetic permeability greater than the magnetic permeability of air. According to the method, a sensitive element, which emits an alternating magnetic field, is brought towards the layer of rubber-like material whose thickness is to be measured, hysteretic losses in the adjacent reinforcement are measured at terminals of the sensitive element, and a thickness of the layer of rubber-like material is evaluated based on the hysteretic losses.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.