Patent · US Active

Method for measuring the thickness of a layer of rubber-like material

US10190863B2 · kind B2 · utility

0Cited by
5References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 11, 2015
Grant dateJan 29, 2019
Priority date
Expiry dateJan 17, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/123
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method is provided for measuring a thickness of a layer of rubber-like material. The layer of rubber-like material includes a free face in contact with air and a face joined to an adjacent reinforcement made of elements electrically insulated from one another. Each of the elements includes at least one hysteretic material having a magnetic permeability greater than the magnetic permeability of air. According to the method, a sensitive element, which emits an alternating magnetic field, is brought towards the layer of rubber-like material whose thickness is to be measured, hysteretic losses in the adjacent reinforcement are measured at terminals of the sensitive element, and a thickness of the layer of rubber-like material is evaluated based on the hysteretic losses.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.