Sensor circuit
US10191124B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 24, 2017 |
| Grant date | Jan 29, 2019 |
| Priority date | — |
| Expiry date | Aug 24, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/0017
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is a sensor circuit that has little possibility of being accidentally put into a test mode in response to an external input of noise or the like. The sensor circuit includes a clock generation circuit configured to output a control signal that is used to control intermittent operation to a physical quantity detection unit, and to output a sampling signal in a sleep period, a potential detection circuit configured to detect a potential at an output terminal and to output a detection signal, and a clock control circuit configured to output a mode switching signal that is a command to switch the clock generation circuit to a test mode, when a given signal pattern is detected in data that is obtained by sampling the detection signal based on the sampling signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.