Method for analyzing a sample with a non-linear microscopy technique and non-linear microscope associated
US10191268B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Oct 15, 2015 |
| Grant date | Jan 29, 2019 |
| Priority date | — |
| Expiry date | Oct 15, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03H2001/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention concerns a method for generating a pattern of light, this method comprising the following steps: a) emitting an input laser pulse (P1), b) deflecting the input laser pulse (P1) by a first deflector (22) to obtain a first laser pulse, c) deflecting the first laser pulse (P3) by a second deflector (24) to obtain a second laser pulse (P4), and d) focusing the pulse (P4) by an optical element characterized in that: —the first deflector (22) shapes the first laser pulse (P3) according to a first function, —the second deflector (24) shapes the second laser pulse (P4) according to a second function, and—the first function f(x) and the second function g(y) are computed and/or optimized to obtain the desired pattern of light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.