Method and system for detecting line defects on surface of object
US10192301B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 16, 2017 |
| Grant date | Jan 29, 2019 |
| Priority date | — |
| Expiry date | Aug 19, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Method and system for detecting line defects on surface of object are presented. An imaging device captures images of surface of object under ambient and dark field illumination conditions. The images are processed with a plurality of image operations to detect areas of potential defects based on predictable pattern consisting of bright and shadow regions. Areas of potential defect are cut from processed images to sub images. Sub images are stitched together to generate hypotheses of potential defects at locations on surface of object. The hypotheses are classified to determine whether the potential defects are true defects at the locations. Line defect is detected by refining line segments detected on the processed image based on criteria. The criteria include distance from the true defects to the line segments and slops between the true defects and the line segments are less than threshold values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.