Self-latch sense timing in a one-time-programmable memory architecture
US10192629B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 15, 2018 |
| Grant date | Jan 29, 2019 |
| Priority date | — |
| Expiry date | Jan 15, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C7/227
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A programmable memory including a self-latching read data path. A sense amplifier senses the voltage level at a bit line, the bit line communicating the data state of a selected memory cell in its associated column. A data latch coupled to the output of the sense amplifier passes the sensed data state. Set-reset logic is provided that receives the output of the data latch in the read data path and, in response to a transition of the data state in a read cycle, latches the data latch and isolates it from the sense amplifier. The set-reset logic resets the data latch at the start of the next read cycle. In some embodiments, a timer is provided so that the latch is reset after a time-out period in a long read cycle in which no data transition occurs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.