Method and system for analyzing spatial measuring data
US10197394B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 5, 2014 |
| Grant date | Feb 5, 2019 |
| Priority date | — |
| Expiry date | Mar 17, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Some embodiments of the invention include a method for analyzing spatial measuring data. The method may include an evaluation process with a multitude of measurement processes that are timely and/or spatially distributed over the elements of a set of one, two or a multitude of basically identical items, the items each having one or more features. In some embodiments, the multitude of measurement processes include at least a first and a second measurements of spatial data by means of at least one sensor system comprising at least one sensor. In some embodiments, each measurement of spatial data comprises providing a sensor reference system for each sensor, and measuring and/or extrapolating one or more spatial values of the features of an item of the set of items by means of the at least one sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.