Optical measurement system
US10197481B2 · kind B2 · utility
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4References
20Claims
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Key dates
| Filing date | Mar 2, 2015 |
| Grant date | Feb 5, 2019 |
| Priority date | — |
| Expiry date | Mar 2, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/383
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical measurement system comprising a vessel for non-invasively testing a sample material composition in-situ and in real time. The test chamber is configured to hold a sample material composition for a wellbore. The optical measurement system is configured to provide in-situ monitoring of the sample material composition in real time and at high temperature and high pressure. Dimensional and geometrical changes occurring within the sample material composition are monitored using the optical measurement system. The system further performs goniometry on a sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.