Patent · US Active

Electron microscope and method for transmission electron microscopy imaging of sample arrays

US10199198B2 · kind B2 · utility

0Cited by
2References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 17, 2014
Grant dateFeb 5, 2019
Priority date
Expiry dateJul 17, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/26
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of electron microscopy imaging of samples, using an electron microscope (100) having a microscope column (10) and a transfer device (11) with a grid carriage (12), comprises the steps of preparing multiple samples (1) on a single electron microscopy grid (2), including dispensing the samples (1) with a dispenser device (30) on distinct positions on the grid (2), introducing the grid (1) with the transfer device (11) into the microscope column (10), and electron microscopy imaging of the samples (1), wherein the preparing step includes holding the grid (2) on the grid carriage (12) of the transfer device (11) or on a grid holder device (20) provided at the electron microscope (100) and dispensing the samples (1) on the grid (2) while holding it on the grid carriage (12) or on the grid holder device (20). Furthermore, an electron microscope (100) for electron microscopy imaging of samples is described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.