Generating test data from samples using natural language processing and structure-based pattern determination
US10204032B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 11, 2017 |
| Grant date | Feb 12, 2019 |
| Priority date | — |
| Expiry date | Apr 3, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3684
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method may include receiving a plurality of samples that include textual content. The method may include extracting unit values, corresponding to structural units, from the plurality of samples. The structural units may identify characteristics of the plurality of samples to be used to identify pattern information. The pattern information may identify unit values that are shared between at least two samples of the plurality of samples. The method may include generating one or more structural representations based on the unit values. The one or more structural representations may identify the pattern information. The method may include generating one or more additional samples based on the one or more structural representations. The one or more additional samples may include at least one of the unit values, and may be generated based on the pattern information. The method may include outputting the one or more additional samples.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.