Patent · US Active

Test apparatus and testable asynchronous circuit

US10209299B2 · kind B2 · utility

0Cited by

3References

10Claims

0Family size

Assignee

Huawei Technologies Co., Ltd. · CN

Inventors

Zhen XU · Nanhu, CN
Yuqing Zhao · Xi'an, CN
Xiaocheng Liu · Tangxia, CN

Key dates

Filing date	Feb 14, 2017
Grant date	Feb 19, 2019
Priority date	—
Expiry date	Mar 24, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/25
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Disclosed are a test apparatus and a testable asynchronous circuit. The test apparatus includes: a first input end, a second input end, a third input end, a fourth input end, a fifth input end, a first selector, a second selector, a D flip-flop, and a first output end. The first input end is configured to input a data signal or a test result of a previous circuit under test; the second input end is configured to input a test excitation signal or a test result that is output by a previous test apparatus; the third input end is configured to input a clock signal; the fourth input end is configured to input a selection signal; and the fifth input end is configured to input a selection signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.