Method for determining an in-focus position and a vision inspection system
US10210376B2 · kind B2 · utility
3Cited by
9References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 19, 2008 |
| Grant date | Feb 19, 2019 |
| Priority date | — |
| Expiry date | Jun 8, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30024
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In one embodiment of the present invention, a method is disclosed for determining a difference between a sample position and an in-focus position, as well as a vision inspection system. In a first step image data depicting a sample is captured. Next, a feature set is extracted from the image data. Thereafter, the feature set is classified into a position difference value, corresponding to the difference between the sample position and the in-focus position, by using a machine learning algorithm that is trained to associate image data features to a position difference value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.