Method for evaluating quality of tone-mapping image based on exposure analysis
US10210433B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 7, 2017 |
| Grant date | Feb 19, 2019 |
| Priority date | — |
| Expiry date | Sep 7, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/741
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for evaluating quality of tone-mapping image based on exposure analysis is provided, which explores the exposure properties on each area of the high dynamic range image utilizing the pre-exposure method and divides the high dynamic range image into three parts of an easy overexposed area, an easy underexposed area and an easy natural-exposed area, wherein different quality characteristics are extracted in different areas, which is capable of ensuring that the follow-up quality characteristic extraction is more targeted. The present invention takes the difference of distortion between the tone-mapping image and the conventional image into account, and extracts image characteristics such as the abnormal exposure rate, the underexposed residual energy, the overexposed residual energy and the exposure color index, so as to accurately reflect the quality degradation of the tone-mapping image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.