Skip track flaw scan methods and systems
US10210899B1 · kind B1 · utility
0Cited by
7References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 21, 2018 |
| Grant date | Feb 19, 2019 |
| Priority date | — |
| Expiry date | May 21, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2020/1826
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for scanning for flaws on a magnetic recording medium is disclosed. The magnetic recording medium has a first set of nonconsecutive data tracks and a second set of nonconsecutive data tracks. The method includes writing a test pattern to only the first set of nonconsecutive data tracks of the magnetic recording medium, reading of the test pattern written to the first set of nonconsecutive data tracks, and identifying flaws within the first set of nonconsecutive data tracks and the second set of nonconsecutive data tracks based on the reading the test pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.