Patent · US Active

Testing system for optical aiming systems with light emitter systems including testing system for thermal drift and related methods

US10215531B2 · kind B2 · utility

0Cited by
4References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 17, 2017
Grant dateFeb 26, 2019
Priority date
Expiry dateMar 20, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M99/002
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Exemplary testing systems and methods are provided including a system configured to test for thermal drift of a unit under test (UUT) under various temperature or environmental conditions and generating an output including visual or data on the thermal drift, if any. The methods involve attaching a UUT to a mounting device within a thermally controlled chamber, collimating light received from a UUT, recording the resulting images, and comparing the results at different temperatures to determine how much thermal drift has occurred. In addition, there are testing apparatuses capable of performing the tests.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.