System for determining at least one property of a sheet dielectric sample using terahertz radiation
US10215696B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 14, 2014 |
| Grant date | Feb 26, 2019 |
| Priority date | — |
| Expiry date | Nov 14, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for determining at least one property of a sheet dielectric sample using terahertz radiation includes at least one terahertz transmitter configured to output a pulse of terahertz radiation, a terahertz receiver configured to receive at least a portion of the pulse of terahertz radiation, wherein the terahertz receiver is configured to output a measured waveform based on the terahertz radiation received by the terahertz receiver, and a control unit in communication with the terahertz receiver. Wherein the control unit is configured to choose at least one region of interest of the measured waveform, compare the at least one region of interest of the measured waveform to a model waveform, vary at least one parameter of a model waveform to minimize the difference between the model waveform and the measured waveform.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.