Secondary electrospray ionization at reduced pressure
US10217623B2 · kind B2 · utility
0Cited by
8References
13Claims
0Family size
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Key dates
| Filing date | Jun 12, 2015 |
| Grant date | Feb 26, 2019 |
| Priority date | — |
| Expiry date | Jul 13, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of mass spectrometry or ion mobility spectrometry is disclosed comprising: providing gas phase analyte in a vacuum housing; electrospraying a reagent solution outside of the vacuum housing so as to form charged droplets of reagent solution and/or reagent ions; conveying the charged droplets and/or reagent ions into the vacuum housing and reacting them with the analyte so as to form analyte ions; and analyzing the analyte ions with a mass analyzer and/or ion mobility analyzer. Reacting the droplets of reagent solution and/or reagent ions with the analyte in sub-atmospheric pressures improved the reaction conditions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.