Integrated measuring system for the spectral measuring technique

US10217890B2 · kind B2 · utility

Assignee

• Fraunhofer-Gesellschaft zur förderung der angewandten Forschung e.V. · DE

Inventors

• Thomas Gessner · Plymouth, US
• Thomas Otto · Würzburg, DE
• Jörg Martin · Thalheim/Erzgebirge, DE
• Alexander W. Weiss · Linden, DE

Key dates

• Filing date: May 15, 2015
• Grant date: Feb 26, 2019
• Expiry date: May 15, 2035

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y02P70/50

Abstract

A measuring system comprises a substrate (IO), which has a quantum dot layer, which is arranged on the substrate and which comprises an emission segment having a first plurality of quantum dots, which first plurality has an average first energy gap, wherein the first plurality can emit radiation corresponding to the average first energy gap, wherein the quantum dot layer comprises at least one absorption segment having a laterally located second plurality of quantum dots and the second plurality has an average second energy gap that is less than the average first energy gap so that radiation emitted by the emission segment can be absorbed by the at least one absorption segment.