Automated defect diagnosis from machine diagnostic data
US10223185B2 · kind B2 · utility
0Cited by
6References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 18, 2016 |
| Grant date | Mar 5, 2019 |
| Priority date | — |
| Expiry date | Jun 8, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L41/026
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Diagnosis of defect(s) in a system is disclosed. A defect signature-based query is performed against system diagnostic data stored in one or more structured records. It is determined that a defect signature is associated with a system based at least in part on the query. Remediation information generated based at least in part on the defect signature and the system diagnostic data may be output.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.