Patent · US Active

Method for automatically separating out the defect image from a thermogram sequence

US10229486B2 · kind B2 · utility

4Cited by

1References

3Claims

0Family size

Assignee

University of Electronic Science and Technology of China · CN

Inventors

Bin Gao · Beijing, CN
Xiaoqing Li · Newark, US
Guiyun Tian · Sichuan, CN

Key dates

Filing date	May 30, 2017
Grant date	Mar 12, 2019
Priority date	—
Expiry date	Jun 5, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/20072
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method automatically separates out the defect image from a thermogram sequence based on the physical characteristics of the defect of a conductive material in electromagnetic field. Defect area radiates more heat than other area, when it is mapped to the histogram of the image to be separated, the defect area is located in the top-end of histogram, and the proportion of defect area is smaller to the background or other area. The method equally divides the histogram of the image to be separated into multi groups, and calculates the first derivative ki of total pixel number Si of group i, finds the maximum absolute value of ki, i.e. |ki|max, where i is expressed as imax; if imax is the last group, Wn is regarded as threshold T, otherwise, Wi+1 is selected as threshold T. The pixels that less than threshold T are removed to obtain the defect image in ECPT.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.