Method of offset calibration in a successive approximation register analog-to-digital converter and a successive approximation register analog-to-digital converter
US10230386B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 7, 2017 |
| Grant date | Mar 12, 2019 |
| Priority date | — |
| Expiry date | Dec 7, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/46
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A method of offset calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration bit (B*LSB; B*MSB), analyzing a bit of the digital signal (COUT) and the calibration bit (B*LSB; B*MSB), determining an indication of a presence of offset error, and calibrating the offset error. As the determination of the calibration bit (B*LSB; B*MSB) requires only one additional comparison, when compared to the normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and thus can be performed frequently thereby taking into account time-varying changes due to environmental effects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.