Patent · US Active

Test equipment arrangement having a superheat controller

US10234409B2 · kind B2 · utility

0Cited by

4References

15Claims

0Family size

Assignee

DunAn Microstaq, Inc. · US

Inventors

Arvind Rao · Houston, US
Chen Yang · Austin, US
Jennifer O'Keefe · Austin, US
Buu C. Chung · Kyle, US

Key dates

Filing date	Sep 14, 2016
Grant date	Mar 19, 2019
Priority date	—
Expiry date	Feb 14, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG01M99/008
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test equipment arrangement includes a superheat controller configured for connection to a unit under test, and further configured to test at least one operational parameter of the unit under test.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.