Device and method for measuring plant growth conditions
US10234438B2 · kind B2 · utility
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23Claims
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Key dates
| Filing date | Feb 7, 2014 |
| Grant date | Mar 19, 2019 |
| Priority date | — |
| Expiry date | May 19, 2036 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P60/21
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device (10) and method are provided for measuring the plant growth conditions within a substrate. A first and a second linear arrays of probes (16, 18) are used, allowing multiple measurements of properties of the substrate. Using multiple measurements at different levels in the substrate and then combining these multiple measurements, allows plant growth conditions to be accurately derived.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.