Patent · US Active

Light-microscopic method of localization microscopy for localizing point objects

US10234672B2 · kind B2 · utility

0Cited by
5References
16Claims
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Key dates

Filing dateJul 1, 2014
Grant dateMar 19, 2019
Priority date
Expiry dateMay 20, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B27/58
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A light-microscopic method of localization microscopy for localizing point objects in a sample arranged in an object space includes imaging, by an imaging optical unit having a depth of field range of predetermined axial z-extension along its optical axis in the object space, the sample onto a detector; localizing the point objects in the sample within the depth of field range in that, on the basis of a sample image, lateral x/y-positions of the point objects in a direction perpendicular to the optical axis are ascertained; displacing, in the object space relative to the sample the depth of field range within which the point objects are localized in the object space relative to the sample along the optical axis at least once by a predetermined axial z-travel distance; and imaging, by the imaging optical unit in the event of an axially displaced depth of field range.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.