Storage error type determination
US10235233B2 · kind B2 · utility
0Cited by
4References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 27, 2016 |
| Grant date | Mar 19, 2019 |
| Priority date | — |
| Expiry date | Jan 21, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/1048
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure relates to an apparatus and a method for collecting failure/error history lists to identify and categorize erring memory locations in randomly accessible memory of a computer system. Method and apparatus consistent with the present disclosure may identify whether particular memory cells, rows of memory cells, or columns of memory cells within a memory device are associated with transient or persistent errors. These methods and apparatus may also avoid using portions of memory that have been associated with persistent errors or failures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.