Measurement system, information processing apparatus, information processing method, and medium
US10240982B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 18, 2017 |
| Grant date | Mar 26, 2019 |
| Priority date | — |
| Expiry date | Sep 23, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/56
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement apparatus includes an illumination unit configured to illuminate a measurement object with use of a plurality of point light sources configured to emit light based on illumination images modulated according to periodic functions out of phase with one another, an imaging unit configured to image the measurement object illuminated based on the illumination images, a first calculation unit configured to calculate phase information of a change in a luminance value at each of pixels based on a plurality of images captured by the imaging unit, and a first acquisition unit configured to acquire, from the phase information, a maximum reflection direction where a reflection direction is maximized on the measurement object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.