Patent · US Active

Probe tip and probe assembly

US10241133B2 · kind B2 · utility

8Cited by

2References

16Claims

0Family size

Assignee

Tektronix, Inc. · US

Inventors

Julie A. Campbell · Beaverton, US
William A. Hagerup · Portland, US
Ira G. Pollock · Beaverton, US
Christina D. Enns · Beaverton, US
James E. Spinar · Sandy, US
Kathleen F. M. Ullom · West Linn, US
Charles M. Hartmann · Forest Grove, US
Daniel J. Ayres · Warren, US

Key dates

Filing date	Nov 7, 2017
Grant date	Mar 26, 2019
Priority date	—
Expiry date	Nov 7, 2037

Classification

Technology area (CPC H)Electricity
CPC primaryH01R2201/20
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test probe tip can include a resistive element coupled with a tip component. The resistive element can include a resistive layer disposed on an exterior surface of a structural member of the resistive impedance element. In embodiments, the resistive element can be configured to form a structural component of the test probe tip without an insulating covering applied thereto. Additional embodiments may be described and/or claimed herein.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.