Method and apparatus for determining differences in geometry of subject element using landmarks
US10244967B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 8, 2017 |
| Grant date | Apr 2, 2019 |
| Priority date | — |
| Expiry date | Jun 8, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30204
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method, performed by a computer, for measuring geometric length and offset differences of a subject element using landmarks obtained through, for example, analysis of medical data images. The method may include obtaining medical image data from a medical imaging device. The method includes measuring, by the computer, a first landmark vector between a femoral landmark and a second landmark at a first point in time from, for example, the medical data images. Further, the method includes measuring, by the computer, a second landmark vector between the femoral landmark and the second landmark at a second point in time which is later than the first point in time from, for example, the medical data images. Calculating an orthogonal projection of the first landmark vector into a sagittal plane and using the direction of the orthogonal projection of the first landmark vector into the sagittal plane as a length direction. Calculating a direction which is perpendicular to the sagittal plane and using this direction as an offset direction and calculating the length difference in the length direction and the offset difference in the offset direction from the first landmark vector and the sec…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.