Measuring depth of a surface of a test object
US10247548B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2015 |
| Grant date | Apr 2, 2019 |
| Priority date | — |
| Expiry date | Apr 5, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/22
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring the depth of a surface of a test object may include projecting a colored fringe pattern formed by a sequence of colored fringes onto a surface of the test object, and detecting and evaluating a fringe pattern reflected by the surface of the test object using an evaluation device. The colored fringe pattern and the evaluation device may be designed such that the depth of the surface of the test object is measured based on the sequence of colored fringes of the reflected fringe pattern and based on a sequence of fringe widths of the reflected fringe pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.