Device for characterizing an interface of a structure and corresponding device
US10247659B2 · kind B2 · utility
0Cited by
7References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2015 |
| Grant date | Apr 2, 2019 |
| Priority date | — |
| Expiry date | Sep 13, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/638
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a device (1) for characterizing an interface of a structure (6), said structure (6) comprising a solid first material and a second material, the materials being separated by said interface. The device (1) comprises: The invention also relates to a corresponding method of characterization.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.