Systems and methods for wireless device testing
US10247773B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 1, 2016 |
| Grant date | Apr 2, 2019 |
| Priority date | — |
| Expiry date | Jan 16, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04W88/06
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
The disclosed systems, devices, and methods may provide for wireless testing of devices and, in particular, wireless testing of semiconductor devices comprising integrated circuits, memory, and logic circuitry that can be present on a wafer. The semiconductor devices can be tested for functional defects by applying one or more test patterns to the semiconductor devices. Further, for devices under test that do not have built-in wireless connectivity (for example, those that do not have a built-in Bluetooth low-energy engine), the disclosure describes systems and methods that the devices under test can use for external wireless connectivity (e.g., an external board having Bluetooth low-energy) on the low-bandwidth interface. In one example embodiment, for high-bandwidth scan testing, wireless connectivity modules (such as those implementing WiFi or WiGig) are described, which can be used to meet the bandwidth requirements of the one or more tests.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.