Low-noise CMOS image sensor
US10249671B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 13, 2017 |
| Grant date | Apr 2, 2019 |
| Priority date | — |
| Expiry date | Nov 13, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F39/80373
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A CMOS pixel including a photodiode having a terminal connected to a potential GND and another terminal connected to a sense node by a first MOS transistor; a second MOS transistor connecting the sense node to a potential VDDH; and a third MOS transistor having its gate connected to the sense node, the transistors having a same gate insulator thickness, wherein the third transistor has a gate length and/or width smaller than those of the first and second transistors, wherein difference VDDH-GND is greater than the nominal voltage of the third MOS transistor, and wherein the body or drain region of the third transistor is connected to a potential VL between potentials VDDH and GND.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.