Automatic device testing
US10250873B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 19, 2017 |
| Grant date | Apr 2, 2019 |
| Priority date | — |
| Expiry date | Jul 19, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N21/4425
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A device can receive an indication to perform a test of a capability of the device to receive data. The data can have a threshold data rate. The device can perform an action to cause the device to receive the data from a source of the data at the threshold data rate. The device can monitor a set of metrics related to the data or a performance of the device. The device can perform an analysis of the set of metrics after monitoring the set of metrics. The device can identify a source of an error based on a result of performing the analysis of the set of metrics. The source of the error can be related to the data or the performance of the device. The device can perform another action related to fixing the source of the error.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.