Test circuits for integrated circuit counterfeit detection
US10254334B2 · kind B2 · utility
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10Claims
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Assignee
Inventors
Key dates
| Filing date | Jul 24, 2018 |
| Grant date | Apr 9, 2019 |
| Priority date | — |
| Expiry date | Jul 24, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L9/3255
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.